Top 10 similar words or synonyms for xeds

edxa    0.800086

edax    0.794339

edxs    0.778400

wdx    0.693846

edxrf    0.683501

mssbauer    0.681250

edx    0.676128

xas    0.674609

mossbauer    0.667415

nexafs    0.661581

Top 30 analogous words or synonyms for xeds

Article Example
XHVOX-FM XHVOX began operations in 1939 as XEDS-AM 1400, owned by Alejandro A. Schober. In 1960, Schober sold the station, and it became XEOW-AM, broadcasting on 970 kHz. It was owned by Mendivil y Elizalde, S.A. until its sale to Amplitud Modulada de Sinaloa, S.A., in 1985. Amplitud Modulada rechristened the station XEVOX-AM.
XHTTT-FM XHTTT began as XEDS-AM 1470, with a concession awarded on October 21, 1961 to Luz María H. de Águilar. It was sold to its current concessionaire in the late 1960s. In the 1990s, it changed its calls to XETTT-AM, also moving to 930 AM. Ultimately, it migrated to FM in 2011.
Energy-dispersive X-ray spectroscopy Energy-dispersive X-ray spectroscopy (EDS, EDX, EDXS or XEDS), sometimes called energy dispersive X-ray analysis (EDXA) or energy dispersive X-ray microanalysis (EDXMA), is an analytical technique used for the elemental analysis or chemical characterization of a sample. It relies on an interaction of some source of X-ray excitation and a sample. Its characterization capabilities are due in large part to the fundamental principle that each element has a unique atomic structure allowing a unique set of peaks on its electromagnetic emission spectrum (which is the main principle of spectroscopy).
Scanning transmission electron microscopy In energy-dispersive X-ray spectroscopy (EDX) or (EDXS), which is also referred to in literature as X-ray energy dispersive spectroscopy (EDS) or (XEDS), an X-ray spectrometer is used to detect the characteristic X-rays that are emitted by atoms in the sample as they are ionized by electron in the beam. In STEM, EDX is typically used for compositional analysis and elemental mapping of samples. Typical X-ray detectors for electron microscopes cover only a small solid angle, which makes X-ray detection relatively inefficient since X-rays are emitted from the sample in every direction. However, detectors covering large solid angles have been recently developed, and atomic resolution X-ray mapping has even been achieved.
Electron energy loss spectroscopy EELS is spoken of as being complementary to energy-dispersive x-ray spectroscopy (variously called EDX, EDS, XEDS, etc.), which is another common spectroscopy technique available on many electron microscopes. EDX excels at identifying the atomic composition of a material, is quite easy to use, and is particularly sensitive to heavier elements. EELS has historically been a more difficult technique but is in principle capable of measuring atomic composition, chemical bonding, valence and conduction band electronic properties, surface properties, and element-specific pair distance distribution functions. EELS tends to work best at relatively low atomic numbers, where the excitation edges tend to be sharp, well-defined, and at experimentally accessible energy losses (the signal being very weak beyond about 3 keV energy loss). EELS is perhaps best developed for the elements ranging from carbon through the 3d transition metals (from scandium to zinc). For carbon, an experienced spectroscopist can tell at a glance the differences between diamond, graphite, amorphous carbon, and "mineral" carbon (such as the carbon appearing in carbonates). The spectra of 3d transition metals can be analyzed to identify the oxidation states of the atoms. Cu(I), for instance, has a different so-called "white-line" intensity ratio than does Cu(II). This ability to "fingerprint" different forms of the same element is a strong advantage of EELS over EDX. The difference is mainly due to the difference in energy resolution between the two techniques (~1 eV or better for EELS, perhaps a few tens of eV for EDX).